The Case for Reconfigurable Components with Logic Scrubbing:
Regular Hygiene Keeps Logic FIT (low)
André DeHon
Proceedings of the IEEE
International Workshop on Design and Test of Nano Devices, Circuits
and Systems, pp. 67--70 (NDCS, September 29--30, 2008)
As we approach atomic-scale logic, we must accommodate an increased rate of
manufacturing defects, transient upsets, and in-field persistent failures.
High defect rates demand reconfiguration to avoid defective components, and
transient upsets demand online error detection to catch failures.
Combining these techniques we can detect in-field persistent failures when
they occur and reconfigure around them. However, since failures may be
logically masked for long periods of time, persistent failures may
accumulate silently; this integration of errors over time
means the effective failure rate for persistent errors can exceed
transient upset rates. As a result, logic scrubbing is necessary to
prevent the silent accumulation of an undetectable number of persistent
errors. We provide simple analysis to illustrate quantitatively how this
phenomena can be a concern.
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