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Implementation of Computation Group


Fault-Tolerant Sub-lithographic Design with Rollback Recovery

Helia Naeimi and André DeHon
Nanotechnology, Volume 19, Number 11, Article 115708, March 19, 2008.

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pf=10-7) in systems with 1012 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based Programmable Logic Arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate-level feed-forward redundancy scheme.

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